0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 6135-01-487-6275
NSN 5905-00-945-7162
NSN 5965-01-422-9770
NSN 5855-01-534-3724
NSN 5965-00-096-7370
NSN 5905-01-135-8657
NSN 5935-01-604-8781
NSN 5945-01-114-1288
NSN 6135-00-503-7213
NSN 7035-01-524-8969
NSN 5925-00-005-7053
NSN 6110-01-406-2934