0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5910-00-482-2279
NSN 5975-01-397-4810
NSN 5855-01-225-5855
NSN 6645-01-090-2555
NSN 6610-01-182-0089
NSN 5910-00-195-8052
NSN 6685-00-119-4406
NSN 5975-01-055-5633
NSN 7035-00-529-3128
NSN 5835-00-377-7020
NSN 5990-00-594-7291
NSN 5915-01-391-0136