0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 2925-01-041-8201
NSN 5855-01-416-1527
NSN 5905-00-172-9314
NSN 6650-01-211-2673
NSN 5935-00-291-0954
NSN 6135-00-461-3590
NSN 6135-01-236-8603
NSN 5925-01-435-4409
NSN 5965-00-263-6436
NSN 6240-01-597-4870
NSN 2925-01-283-3576
NSN 5999-00-900-4778