0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5965-01-484-2743
NSN 6650-01-380-5691
NSN 5975-01-535-6604
NSN 5905-00-597-6081
NSN 6130-01-045-4032
NSN 6645-00-779-5355
NSN 6685-00-564-9367
NSN 4140-00-703-3207
NSN 5930-01-325-5611
NSN 5935-00-138-4996
NSN 5999-01-394-7675
NSN 5895-01-449-1371