0.458 in. Probe dia
An item with or without attaching cable designed to detect flaws, cracks and the like on surface or near surface metals. Establishes a magnetic field through the probe coil and locates the resulting magnetic disturbance in the item under test. Used in conjunction with detector, metal flaw, electronic. Excludes prod, test.
Classification: Instrument and apparatus for physical or chemical analysis using optical radiations, nesoi
NSN 5950-00-295-8202
NSN 6610-00-763-2415
NSN 6145-00-854-1892
NSN 6240-01-409-2465
NSN 5905-00-815-6871
NSN 5895-01-174-7384
NSN 5925-01-126-5278
NSN 6105-01-496-1844
NSN 5935-00-696-5762
NSN 2925-00-172-9264
NSN 5895-01-445-2270
NSN 6130-00-052-6248